Hioki In-Circuit Testers (ICT)

1220 Bed-of-Nails (BON) In-Circuit Tester

  • High-speed and efficient in-circuit testing
  • Automatic Test Generation (ATG) function
  • Remote self-diagnostic feature
  • Data stored in CSV format for off-line analysis
  • Wide range measurement capabilities
  • Compact, space-saving footprint
  • User-friendly Windows® 10 operation

Key Features

Different models available to fit your needs

  • 1220-50: Desk top model. *Works with third party presses and BON fixtures.
  • 1220-51: Off-line model
  • 1220-52: Off-line model, space saving type.
  • 1220-55: In-line model

Hioki In-Circuit Testers Porduct Lineup

Functions combined in one bench-top cabinet

In-circuit testing functions are assembled into a system or line to save space in the testing facility, enabling easy support of cell production.

Macro Test

Includes the macro test, a high-performance capability for testing even with only a few measurement points

High-speed test 1

Faster in-circuit testing is achieved by a new measurement board design

High-speed test 2

Optional board parallel testing greatly shortens test time. Remote self-diagnostics Self-diagnosis of Model 1220 can be initiated over the Internet, enabling remote maintenance support even at factories located overseas.

Compatibility

Test data from the HIOKI 1105 can be converted. Model 1101/1102 test data can be converted by the 1137-02 data generation software. Data conversion functions also support data from other companies.

System Development

Because of its easy network configuration, customers can operate the system as their requirements demand. Test data from multiple 1220s can be centrally managed by a server PC. Applications can be constructed to include operations such as capturing test history, statistical data and operating conditions of each machine.

Scanner Boards

Two types of boards are available: scanner boards for speed, and relay boards for high power and precision. A variety of test functions are available to suit individual applications.

User Interface

Communication with Windows-based PCs via LAN is available. Operation is easy in an environment familiar to everyone.

Strengthened Data Editing Functions

Use these functions to develop and modify groups of test data such as for multi-cut boards or data managed in multiple files, by modifying only the necessary parts.

Statistical Analysis

Data measured by Model 1220 can be saved to a PC’s hard disk for each board tested. Data is stored in CSV format, which can be adapted to many applications.

Hioki In-Circuit Testers (ICT): Representatives

Seika Machinery, Inc. Los Angeles Head Office & Demo Center

Address:
21241 S. Western Ave.
Suite 140
Torrance, CA 90501 USA
Driving Directions
Phone:
(310) 540-7310
Fax:
(310) 540-7930
Email:
info@seikausa.com

Seika Machinery, Inc. Atlanta Branch Office & Demo Center

Address:
1580 Boggs Rd.,
Suite 900
Duluth, GA 30096 USA
Driving Directions
Phone:
(770) 446-3116
Fax:
(770) 446-3118
Email:
info@seikausa.com

Seika Machinery, Inc. San Francisco Branch Office

Address:
23785 Cabot Blvd.
Suite 306
Hayward, CA 94545 USA
Driving Directions
Phone:
(510) 293-0580
Fax:
(510) 293-0940
Email:
info@seikausa.com
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