Seika to Promote Its Latest Router and Probe Tester at SMTA Wisconsin: Article

TORRANCE, CA — September 2013— Seika Machinery, Inc., a leading provider of advanced machinery, materials and engineering services, announces that it will highlight the Sayaka SAM-CT23W and HIOKI 1240 at the SMTA Wisconsin/Great Lakes

Expo & Tech Forum, scheduled to take place Wednesday, September 18, 2013 at the Crowne Plaza Milwaukee Airport in Wisconsin.

The two-way flexible setting twin-table design provides faster, high precision processing and accommodates two boards up to 9.8×13″ (250x330mm). The flexible twin fixture tables can be converted into one large size fixture table that accommodates one PCB up to 13×20″ (330x500mm). The automatic bit depth control feature extends bit life and reduces bit usage. Additional features include large component height clearance (top- and bottom-sides) as well as an easy-to-use, CAD-based, off-line software program.

The HIOKI 1240 Flying Probe Tester provides a variety of benefits compared to conventional testing machinery. Some of these benefits include jig-less inspection for quick setup, and the proficient testing of mis-mounted components, faulty components, and poor contacts. Through resistance testing, the flying probe test is able to assess solder joints promptly, while still thwarting board damage through use of the soft-landing feature. HIOKI features a four-wire measurement function and the capabilities of the series extends to the active in-circuit test of FETs, relays, as well as three-terminal voltage regulators – applications that are regarded as challenging test issues for conventional equipment.

Additionally, the HIOKI1240 Flying Probe ICT features the HIOKI UA1780 Gerber Data Editing Software. With the software, users can now easily create high-quality test data without boards. The system features easy-to-use Windows-based operation and support